The Terahertz Group - Prof. Dr. Roland Kersting
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Research

The objective of our experimental works is to measure fundamental transport properties of charge carriers in semiconductors. For many novel materials, properties such as the charge carrier's scattering times, their effective masses, mobilities or conductivities are unknown because they are not accessible by conventional characterization techniques. Time-resolved THz spectroscopy is a novel tool that provides access to these parameters, which are essential for the development of electronic and optoelectronic devices.

 

[8] T. R. Arend, A. Wimmer, G. Schweicher, B. Chattopadhyay, Y. H. Geertes, and R. Kersting. Band transport and trapping in
didodecyl[1]benzothieno[3,2-b][1]benzothiophene probed by terahertz spectroscopy,  J. Phys. Chem. Lett. 8, 5444 (2017).

[7] T. R. Arend, M. Tönnies, P. Reisbeck, C. J. P. Rieckmann, and R. Kersting. Physical vapor deposition of methylammonium tin iodide thin films, Phys. Status Solidi A, 214, 10.1002/pssa.201600796, (2017).

[6] S. G. Engelbrecht, T. R. Arend, T. Zhu, M. J. Kappers, and R. Kersting, Terahertz electromodulation spectroscopy of electron transport in GaN, Appl. Phys. Lett. 106, 092107 (2015).

[5] S. G. Engelbrecht, M. Prinz, T. R. Arend, and R. Kersting. Terahertz spectroscopy on hole transport in pentacene thin films, Appl. Phys. Lett. 105, 012101 (2014).

[4] S.G. Engelbrecht, L. De Angelis, M. Tönnies, and R. Kersting. Electronic response in mesoscopically disordered ZnO probed by terahertz spectroscopy, Appl. Phys. A, 113, 641 (2013).

[3] S. G. Engelbrecht, T. R. Arend, T. Zhu, M. J. Kappers, and R. Kersting, Terahertz electromodulation spectroscopy of electron transport in GaN, Appl. Phys. Lett. 106, 092107 (2015).

[2] S.G. Engelbrecht, A.J. Reichel, and R. Kersting. Charge carrier relaxation and effective masses in silicon probed by terahertz spectroscopy, J. Appl. Phys. 112, 123704 (2012).

[1] S. Funk, G. Acuna, M. Handloser, and R. Kersting. Probing the momentum relaxation time of charge carriers in ultrathin layers with terahertz radiation, Opt. Expr. 17, 17450 (2009).